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Determination of selenium at trace levels in geologic materials by energy-dispersive X-ray fluorescence spectrometry

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Determination of selenium at trace levels in geologic materials by energy-dispersive X-ray fluorescence spectrometry; 1981; Article; Journal; Chemical Geology; Wahlberg, J. S.

Summary

Low levels of selenium (0.1-500 ppm) in both organic and inorganic geologic materials can be semiquantitatively measured by isolating Se as a thin film for presentation to an energy-dispersive X-ray fluorescence spectrometer. Suitably pulverized samples are first digested by fusing with a mixture of Na2CO3 and Na2O2. The fusion cake is dissolved in distilled water, buffered with NH4Cl, and filtered to remove Si and the R2O3 group. A carrier solution of Na2TeO4, plus solid KI, hydrazine sulfate and Na2SO3, is added to the filtrate. The solution is then vacuum-filtered through a 0.45-??m pore-size filter disc. The filter, with the thin film of precipitate, is supported between two sheets of Mylar?? film for analysis. Good agreement is [...]

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Author :
J.S. Wahlberg
Publisher :
Elsevier

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Harvested on Mon Jul 21 11:57:20 MDT 2014 from MODS XML Service

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Type Scheme Key
local-index unknown 70011746
local-pk unknown 70011746
doi http://www.loc.gov/standards/mods/mods-outline-3-5.html#identifier doi:10.1016/0009-2541(81)90092-9
series unknown Chemical Geology

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citationTypeArticle
journalChemical Geology
languageEnglish
parts
typevolume
value33
typeissue
value1-4

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