X-ray florescence (XRF) spectroscopic analyses were performed at UAF using a PANalytical Axios spectrometer under vacuum. The measurements were standardized using well-characterized, natural, fine-grained rock and pure mineral standards as well as conventional pressed pellets of international rock standards. Because no volatile components were measured and rocks were of varying porosities, the analyses were normalized to 100 percent totals. In the vast majority of cases the original analyses yielded totals of approximately 95 to 102 weight percent. Comparison between these analyses and those produced on the same rocks by conventional pressed pellet (for trace elements) and fused disk (for major and minor oxides) techniques indicates [...]
