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Research examining organic-matter hosted porosity has significantly increased during the last ten years due to greater focus on understanding hydrocarbon migration and storage in source-rock reservoirs, and technological advances in scanning electron microscopy (SEM) capabilities. The examination of nanometer-scale organic-matter hosted porosity by SEM requires the preparation of exceptionally flat geologic samples beyond the abilities of traditional mechanical polishing which can deform or otherwise obscure organic surfaces. To meet this demand, broad ion beam (BIB) milling was introduced as a sample preparation technique for SEM petrographic analysis of geologic samples. But like with any sample preparation technique,...


    map background search result map search result map Evaluation of pore-like features in sedimentary organic matter Evaluation of pore-like features in sedimentary organic matter